Stock image for illustration purposes only - book cover, edition or condition may vary.
Applied Scanning Probe Methods III
. Ed(S): Bhushan, Bharat; Fuchs, Harald
€ 188.04
FREE Delivery in Ireland
Description for Applied Scanning Probe Methods III
Hardback. Provides a comprehensive overview of SPM applications. The international perspective offered in these three volumes contributes to the evolution of SPM techniques. Volumes II, III and IV examine the physical and technical foundation for progress in applied near-field scanning probe techniques. Editor(s): Bhushan, Bharat; Fuchs, Harald. Series: Nanoscience and Technology. Num Pages: 422 pages, 268 black & white illustrations, 2 colour illustrations, 3 black & white tables, biograph. BIC Classification: PDND. Category: (P) Professional & Vocational. Dimension: 243 x 166 x 21. Weight in Grams: 716.
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The ... Read more
The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The ... Read more
Product Details
Format
Hardback
Publication date
2005
Publisher
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Germany
Number of pages
422
Condition
New
Series
Nanoscience and Technology
Number of Pages
378
Place of Publication
Berlin, Germany
ISBN
9783540269090
SKU
V9783540269090
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
Reviews for Applied Scanning Probe Methods III
From the reviews: "The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. … As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for ... Read more