Stock image for illustration purposes only - book cover, edition or condition may vary.
Advances in Speckle Metrology and Related Techniques
Guillermo H. . Ed(S): Kaufmann
€ 155.89
FREE Delivery in Ireland
Description for Advances in Speckle Metrology and Related Techniques
Edited by the Chair of the Speckle 2010 Conference . The most up-to-date picture of the field of speckle metrology today . Describes new techniques developed in the field of speckle metrology during the last decade, and its applications to experimental mechanics, material science, optical testing, and fringe analysis . Editor(s): Kaufmann, Guillermo H. Num Pages: 327 pages, Illustrations. BIC Classification: TTB. Category: (P) Professional & Vocational. Dimension: 249 x 179 x 21. Weight in Grams: 770.
Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches.
This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the last decade, as well as applications to experimental mechanics, material ... Read more
Show LessProduct Details
Publication date
2011
Publisher
Wiley-VCH Verlag GmbH Germany
Number of pages
327
Condition
New
Number of Pages
327
Format
Hardback
Place of Publication
Berlin, Germany
ISBN
9783527409570
SKU
V9783527409570
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
About Guillermo H. . Ed(S): Kaufmann
Prof. Guillermo H. Kaufmann is professor of Applied Optics at the National University of Rosario, Argentina, and chief scientist at the Physics Institute of Rosario which is linked both to the university and to the National Council of Scientific and Technological Research. He is also the director of the French-Argentine International Centre for Information and Systems Sciences. He has worked ... Read more
Reviews for Advances in Speckle Metrology and Related Techniques
"Each chapter presents a systematic exposition describing the techniques and applications, with all necessary formulae, and concluding with a full list of references, making this an ideal resource for the graduate student seminar as well as for engineers and scientists." (Book News, 1 August 2011)