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Nanoscale Phenomena in Ferroelectric Thin Films
. Ed(S): Hong, Seungbum (Samsung Advanced Institute Of Technology, Suwon, Korea)
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Description for Nanoscale Phenomena in Ferroelectric Thin Films
Hardback. Presents the advances in the field of nanoscale science and engineering of ferroelectric thin films. This work consists of two main parts: electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Editor(s): Hong, Seungbum (Samsung Advanced Institute of Technology, Suwon, Korea). Series: Multifunctional Thin Film Series. Num Pages: 288 pages, biography. BIC Classification: PNK; TBN; TGM; TJFD5. Category: (G) General (US: Trade); (P) Professional & Vocational; (U) Tertiary Education (US: College). Dimension: 234 x 156 x 19. Weight in Grams: 609.
This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, i.e. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well known le'adingexperts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland, Korea) were invited to contribute to each chapter. The first part under the title of electrical characterization in nanoscale ferroelectric capacitors starts with Chapter 1, "Testing and characterization of ferroelectric thin film capacitors," written by Dr. I. K. Yoo. The author provides a comprehensive review ... Read more
This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, i.e. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well known le'adingexperts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland, Korea) were invited to contribute to each chapter. The first part under the title of electrical characterization in nanoscale ferroelectric capacitors starts with Chapter 1, "Testing and characterization of ferroelectric thin film capacitors," written by Dr. I. K. Yoo. The author provides a comprehensive review ... Read more
Product Details
Format
Hardback
Publication date
2004
Publisher
Springer-Verlag New York Inc. United States
Number of pages
288
Condition
New
Series
Multifunctional Thin Film Series
Number of Pages
288
Place of Publication
New York, NY, United States
ISBN
9781402076305
SKU
V9781402076305
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15
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