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Semiconductor Material and Device Characterization
Dieter K. Schroder
€ 286.52
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Description for Semiconductor Material and Device Characterization
Hardcover. This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Num Pages: 800 pages, illustrations. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 238 x 164 x 42. Weight in Grams: 1199.
This Third Edition updates a landmark text with the latest findings
Read moreThe Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth...
Product Details
Format
Hardback
Publication date
2006
Publisher
John Wiley and Sons Ltd United Kingdom
Number of pages
800
Condition
New
Number of Pages
800
Place of Publication
, United States
ISBN
9780471739067
SKU
V9780471739067
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-50
About Dieter K. Schroder
DIETER K. SCHRODER, PhD, is Professor, Department of Electrical Engineering, Arizona State University. He is a recipient of the ASU College of Engineering Teaching Excellence Award and several other teaching awards. In addition to Semiconductor Material and Device Characterization, Dr. Schroder is the author of Advanced MOS Devices.
Reviews for Semiconductor Material and Device Characterization
“The book is well-illustrated and provides an ample bibliography.” (Optics & Photonics News, 4 November 2015) "I strongly recommend this book for those who want to learn device characterization." (IEEE Circuits & Devices Magazine, November/December 2006)