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Aberration-Corrected Analytical Transmission Electron Microscopy
Rik Brydson
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Description for Aberration-Corrected Analytical Transmission Electron Microscopy
Hardcover. The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. Editor(s): Brydson, Rik. Series: Royal Microscopical Society. Num Pages: 296 pages, Illustrations. BIC Classification: PDND. Category: (P) Professional & Vocational. Dimension: 240 x 164 x 20. Weight in Grams: 580.
The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
Product Details
Format
Hardback
Publication date
2011
Publisher
John Wiley & Sons Inc United Kingdom
Number of pages
296
Condition
New
Series
Royal Microscopical Society
Number of Pages
304
Place of Publication
New York, United States
ISBN
9780470518519
SKU
V9780470518519
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-1
About Rik Brydson
Professor R.M.D. (Rik) Brydson is based in the School of Process, Environmental and Materials Engineering at the University of Leeds, UK. He is a committee member for the European Microscopy Society as well as the Electron Microscopy and Analysis Group (Institute of Physics).
Reviews for Aberration-Corrected Analytical Transmission Electron Microscopy
“This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).” (Imaging & Microscopy, 1 March 2012)