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Echlin, Patrick; Fiori, C.e.; Goldstein, Joseph; Joy, David C.; Newbury, Dale E. (National Institute Of Standards And Technology, Gaithersburg, Md, U - Advanced Scanning Electron Microscopy and X-Ray Microanalysis - 9781475790290 - V9781475790290
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis

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Description for Advanced Scanning Electron Microscopy and X-Ray Microanalysis Paperback. Num Pages: 454 pages, biography. BIC Classification: MMF; TGMT. Category: (P) Professional & Vocational. Dimension: 229 x 152 x 24. Weight in Grams: 692.
This book has its origins in the intensive short courses on scanning elec­ tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con­ tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro­ ductory and advanced courses. In 1981 the lecturers undertook the project of ... Read more

Product Details

Format
Paperback
Publication date
2013
Publisher
Springer-Verlag New York Inc. United States
Number of pages
454
Condition
New
Number of Pages
454
Place of Publication
New York, NY, United States
ISBN
9781475790290
SKU
V9781475790290
Shipping Time
Usually ships in 15 to 20 working days
Ref
99-15

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