Stock image for illustration purposes only - book cover, edition or condition may vary.
Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
Manuel Servin
€ 147.58
FREE Delivery in Ireland
Description for Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
Hardcover. The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. Num Pages: 344 pages, illustrations (black and white). BIC Classification: PHJ. Category: (P) Professional & Vocational. Dimension: 250 x 175 x 22. Weight in Grams: 898.
The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.
The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.
Product Details
Format
Hardback
Publication date
2014
Publisher
Wiley-VCH Verlag GmbH Germany
Number of pages
344
Condition
New
Number of Pages
344
Place of Publication
Berlin, Germany
ISBN
9783527411528
SKU
V9783527411528
Shipping Time
Usually ships in 4 to 8 working days
Ref
99-1
About Manuel Servin
Manuel Servin received his engineering diploma from the École Nationale Supérieure des Télécommunications in France (1982), and his Ph.D. from the Centro de Investigaciones en �ptica A. C. (CIO) at Leon Mexico in 1994. He is co-author of the book `Interferogram Analysis for Optical Testing?. Dr. Servin has published more than 100 papers in scientific peer-reviewed journals on Digital Interferometry ... Read more
Reviews for Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
“I recommend this book for several reasons: it provides great insights into the principles and practical applications of classical and advanced interferometry in optical metrology, and it presents the main algorithms for recovering the modulating phase from single or multiple patterns.” (Optics & Photonics, 8 October 2014)