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Practical Guide for the Preparation of Specimens for X-ray Flourescence and X-ray Diffraction Analysis
Buhrke
€ 262.98
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Description for Practical Guide for the Preparation of Specimens for X-ray Flourescence and X-ray Diffraction Analysis
Hardcover. X-ray fluorescence (XRF) and x-ray diffraction (XRD) are analytical techniques used to identify substances by examining the amount of energy given off from a substance during an x-ray. The most common errors in XRF analysis and XRD usually occur during preparation of the specimen. Editor(s): Buhrke, Victor E.; Jenkins, Ron; Smith, Deane K. Num Pages: 360 pages, bibliography. BIC Classification: MQH; PNFS. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 243 x 223 x 25. Weight in Grams: 702.
The first hands-on guide to XRD and XRF sampling and specimen preparation
Systematic errors from poor sampling and improper specimen preparation can easily render X-ray diffraction (XRD) and X-ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume.
This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in ... Read more
The first hands-on guide to XRD and XRF sampling and specimen preparation
Systematic errors from poor sampling and improper specimen preparation can easily render X-ray diffraction (XRD) and X-ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume.
This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in ... Read more
Product Details
Format
Hardback
Publication date
1997
Publisher
John Wiley and Sons Ltd United States
Number of pages
360
Condition
New
Number of Pages
360
Place of Publication
, United States
ISBN
9780471194583
SKU
V9780471194583
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-50
About Buhrke
VICTOR E. BUHRKE heads The Buhrke Company in Redwood City, California. RON JENKINS is the general manager of the International Center for Diffraction Data in Newton Square, Pennsylvania. DEANE K. SMITH is a professor emeritus in the Department of Geosciences at Pennsylvania State University.
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