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David Y. Hsu - Spatial Error Analysis - 9780780334533 - V9780780334533
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Spatial Error Analysis

€ 192.87
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Description for Spatial Error Analysis Hardcover. "SPATIAL ERROR ANALYSIS is an all--in--one sourcebook on error measurements in one--, two--, and three--dimensional spaces. This book features exhaustive, systematic coverage of error measurement relationships, techniques, and solutions used to solve general, correlated cases. It is packed with 62 figures and 24 tables. Num Pages: 236 pages, figures, tables. BIC Classification: TBJ; TG; TRP. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (XV) Technical / Manuals. Dimension: 265 x 188 x 19. Weight in Grams: 596.
"SPATIAL ERROR ANALYSIS is an all-in-one sourcebook on error measurements in one-, two-, and three-dimensional spaces. This book features exhaustive, systematic coverage of error measurement relationships, techniques, and solutions used to solve general, correlated cases. It is packed with 62 figures and 24 tables. MATLAB-based M-files* for practical applications created especially for this volume are available on the Web at ftp://ftp.mathworks.com/pub/books/hsu.

Solutions to two- and three-dimensional problems are presented without relying on equal standard deviations from each channel. They also make no assumption that the random variables of interest are independent or uncorrelated.

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Product Details

Format
Hardback
Publication date
1998
Publisher
John Wiley and Sons Ltd United States
Number of pages
236
Condition
New
Number of Pages
236
Place of Publication
, United States
ISBN
9780780334533
SKU
V9780780334533
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-50

About David Y. Hsu
About the Author David Y. Hsu is currently a member of the Senior Technical Staff with the Advanced Systems Analysis Group at Litton Guidance and Control Systems Division. Since 1982, his principal tasks have included gravity modeling/compensation, simulation, and analysis. He has authored over 20 scientific articles in the ION, IEEE Plans, NAECON proceedings, and other Mathematical/Engineering journals. Dr. Hsu ... Read more

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