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Measurement Technology for Micro-Nanometer Devices
Wendong Zhang
€ 156.61
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Description for Measurement Technology for Micro-Nanometer Devices
Hardback. Dealing with the technologies for measurement at the small scale, this book highlights the advanced research work from industry and academia in micro-nano devices test technology Written at both introductory and advanced levels, provides the fundamentals and theories. Num Pages: 352 pages. BIC Classification: TBMM; TBN. Category: (P) Professional & Vocational. Dimension: 250 x 177 x 21. Weight in Grams: 670.
A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale
• Highlights the advanced research work from industry and academia in micro-nano devices test technology
• Written at both introductory and advanced levels, provides the fundamentals and theories
• Focuses on the measurement techniques for characterizing MEMS/NEMS devices
A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale
• Highlights the advanced research work from industry and academia in micro-nano devices test technology
• Written at both introductory and advanced levels, provides the fundamentals and theories
• Focuses on the measurement techniques for characterizing MEMS/NEMS devices
Product Details
Format
Hardback
Publication date
2016
Publisher
John Wiley & Sons Inc United States
Number of pages
352
Condition
New
Number of Pages
352
Place of Publication
New York, United States
ISBN
9781118717967
SKU
V9781118717967
Shipping Time
Usually ships in 7 to 11 working days
Ref
99-16
About Wendong Zhang
WENDONG ZHANG, North University of China, China XIUJIAN CHOU, North University of China, China TIELIN SHI, Huazhong University of Science and Technology, China ZONGMIN MA, North University of China, China HAIFEI BAO, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, China JING CHEN, Peking University, China ... Read more
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